Fault Location on Transmission and Distribution Lines: Principles and Applications

This book provides readers with up-to-date coverage of fault location algorithms in transmission and distribution networks. The algorithms will help readers track down the exact location of a fault in the shortest possible time. Furthermore, voltage and current waveforms recorded by digital relays, digital fault recorders, and other intelligent electronic devices contain a wealth of information. Knowledge gained from analysing the fault data can help system operators understand what happened, why it happened and how it can be prevented from happening again. The book will help readers convert such raw data into useful information and improve power system performance and reliability.

About the Author

Surya Santoso, The University of Texas at Austin, USA
Surya Santoso joined The University of Texas at Austin in 2003, where since 2008 he has been working with the Electric Power Research Institute and U.S utility companies in the broad area of transmission and distribution fault location. He has published and co-authored several books and over 40 journal and 90 conference articles in the past 20 years. Surya Santoso is a Distinguished Lecturer for IEEE Power and Energy Society and Fellow of IEEE.

Swagata Das, The University of Texas at Austin, USA
Swagata Das received her B.Tech in Electrical and Electronics Engineering from SRM University (India) in May 2009 and her MSE degree in Electrical Engineering from The University of Texas at Austin in May 2011, where she is currently working towards her Ph.D. degree. She will join Schweitzer Engineering Laboratories as an Associate Application Engineer (Protection) in March 2015. Her Ph.D. dissertation is on fault location and fault data analysis in transmission and distribution networks. She has been working in this subject area for the past four years and has presented her research to other students and industry professionals at several IEEE Power and Energy Society conferences.

Series

IEEE Press

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