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Optical Imaging and Metrology: Advanced Technologies
ISBN: 978-3-527-41064-4
October 2012
502 pages
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology – an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by leading experts, it fills a gap in the current literature by bridging the fields of optical imaging and metrology, and is a valuable up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.