Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components
and systems as technologies scale from micro- to nano-electronics. This book teaches the fundamentals of
electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS
phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system
design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip,
and system level EOS protection networks, followed by examples in specific technologies, circuits, and
chips. The book is unique in covering EOS manufacturing issues from on-chip design and electronic design
automation to factory-level EOS program management in today’s modern world.

Look inside for extensive coverage on:

• Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA),to physical models for EOS phenomena
• EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures
• EOS failures in both semiconductor devices, circuits and systems
• Discussion of how to distinguish between EOS events and electrostatic discharge (ESD) events, such as the human body model (HBM), charged device model (CDM), cable discharge events (CDM),charged board events (CBE), to system level IEC 61000-4-2 test events
• EOS protection on-chip design practices and how they differ from ESD protection networks and solutions
• Discussion of EOS system level concerns in printed circuit boards (PCB) and manufacturing equipment
• Examples of EOS issues in state-of-the-art digital, analog and power technologies, including CMOS, LDMOS, and BCD
• EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems
• EOS testing and qualification techniques
• Practical off-chip ESD protection and system level solutions to provide more robust systems

Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books
on ESD protection. It is an essential reference and a useful insight into the issues that confront modern
technology as we enter the nano-electronic era.